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The Importance Of Design for Testability (Hebrew)
Board Testers - Diagnostics
Board Testers - Functional Testers
Cable Testers
BackPlane Tester
(12:11 , 05.11.2015)
NEXEYA CANADA INC. established and acquisition of CABLETEST SYSTEMS INC., a company specializing in cable harness, backplane and complex interconnect system testing.
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Vario Tap

emdo bounder scan3



VarioTAP is a revolutionary technology for pattern streaming on TAP (Test Access Port) signals compliant with IEEE Std. 1149.1.
The technology utilizes on-chip emulation resources accessible in many micro-processors and micro-controllers through a IEEE 1149.1 compatible JTAG Port.
The VarioTAP principle was specifically developed for the integrated Boundary Scan software, SYSTEM CASCON™, and enables the complete fusion of Emulation tools with test and In-System-Programming (ISP) applications.
The VarioTAP specific adaptive streaming showcases the dynamic synthesis of Emulation vectors and Boundary Scan vectors, supporting new test strategies such as Interlaced JTAG/Boundary Scan Tests and In-System Emulation Test / ISP.


The VarioTAP technology and its integration in SYSTEM CASCON™ sets new standards for the combination of JTAG Emulation and Boundary Scan in regard to flexibility, modularity, and performance:


Boundary Scan test operations executes in conjunction with Emulation tests (Interlaced JTAG/Boundary Scan)

High Speed On-Chip Flash Programming

Ultra fast programming of FLASH devices external to the µP

Full automated support of Scan Router devices from all leading vendors for In-System applications

Complete integration in SYSTEM CASCON allows interactions with other tools (e.g. the “2008 Best In Test” ScanAssist Debugger)

Utilization of the UUT's existing Boundary Scan project database for process automation

Support of Multi-Processor /Multi-Core systems with one or multiple TAP

Extremely simple user interface utilizing VarioTAP models with pre-configured IP (Intellectual Property)

Allows functional tests and At-Speed test for non-Boundary Scan components (digital/analog)


Simple generation of custom tests without native tool chain for the particular µP family


Simple implementation of existing µP routines for specific test functions, with interaction of Boundary Scan test, ISP, Emulation, and external I/O operations in one application


Single platform for development and implementation of multi-mode test and programming strategies


Fully compatible with hardware platform SCANFLEX® and all ScanBooster™ controllers

Main Benefits:
No need for µP specific Pods

No need for µP specific knowledge

Highest throughput

Simple extension of existing installations and projects

Minimal learning curve for this new technology

Dramatic increase in test coverage even if Design For Test (DFT) quality is limited

Highly efficient project development for extended JTAG/Boundary Scan application

No need for other multiple software and hardware tools for specific µP families and applications (such as emulators exclusively for FLASH programming of a specific type of µP)

Highest flexibility when implementing new test and ISP strategies

Support of complex multi-processor designs (e.g. with 8 different µP types in 8 different scan chains).






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