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The Importance Of Design for Testability (Hebrew)
Board Testers - Diagnostics
Board Testers - Functional Testers
Cable Testers
BackPlane Tester
(12:11 , 05.11.2015)
NEXEYA CANADA INC. established and acquisition of CABLETEST SYSTEMS INC., a company specializing in cable harness, backplane and complex interconnect system testing.
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What is Boundary Scan?


JTAG/Boundary Scan is probably the most ingenious test process, which like ICT, tests within the circuit and detects structural fault locations by setting thousands of test points, even under BGAs, - with only four test bus lines.

Boundary Scan essentially means “testing at the periphery (boundaries) of a circuit”.

In addition to the core logic and the test points, an IC (Integrated Circuit) also features some test control logic. The test points are integrated between the core logic and the physical pins of the IC. This special IC architecture and the test bus connections among each chip are preconditions for the use of Boundary Scan. If they are met it is possible

  • test particular components
  • test the connections among the ICs on the board
  • test the function of complete boards under operating conditions

Not all components on the board have to be testable in order to use the Boundary Scan philosophy. Even if only one component meets the requirement, Boundary Scan can be used for certain test applications. Please ask us to run a testability analysis on your boards to show that there are thousands of components that can be tested with Boundary Scan.

Unlike other test access methodologies, Boundary Scan can be utilised from the beginning to the end of the production of a PCB for the following applications:

  • testing
  • design verification
  • in-system programming
  • debugging
  • emulation

Advantages of the JTAG/Boundary Scan technology

  • usable throughout the entire product life cycle
  • no mechanical access necessary – while still offering very high test coverage
  • accelerates development of new products - reduced Time-to-Market
  • test program generation in a short time - fast turnaround, e.g. for design changes
  • improved product quality by simultaneous testing and programming within one program sequence

cost savings:

  • low initial investment and cost of maintenance compared to other test technologies
  • no storage costs
  • minimal running costs
  • Fast Return-On-Investment


Click on the link to download the article on the Introduction to the JTAG/Boundary Scan Technology

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